TY  - BOOK
AU  - Beyerer,Jurgen
AU  - Richter,Matthias
AU  - Nagel,M.
TI  - Pattern Recognition: introduction, features, classifiers and principles 
T2  - De Gruyter graduate
AV  - TK7882.P3 B49 2018
PY  - 2018///]
CY  - Berlin
PB  - De Gruyter
KW  - Pattern recognition systems
KW  - Electronic books
N1  - Includes bibliographical references and index
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=5159257
ER  -