TY  - BOOK
AU  - Jalabert,Denis
TI  - Swift ion beam analysis in nanosciences
AV  - T174.7 .J353 2017
U1  - 620.5 23
PY  - 2017///
CY  - London, [England], New York
PB  - Routledge
KW  - Nanotechnology
KW  - Electronic books
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=4983681
ER  -