TY  - BOOK
AU  - Gray,Kirk
AU  - Paschkewitz,John James
TI  - Next generation HALT and HASS: robust design of electronics and systems 
T2  - Wiley series in quality and reliability engineering
AV  - TA169.3 .G73 2016
U1  - 621.381028/7 23
PY  - 2016///
CY  - Chichester, West Sussex, United Kingdom, Hoboken, NJ
PB  - Wiley
KW  - Accelerated life testing
KW  - Electronic systems
KW  - Design and construction
KW  - Testing
KW  - Electronic books
N1  - Includes bibliographical references and index; Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=4451897
ER  -