Gray, Kirk, <br/><br/>
Next generation HALT and HASS :  robust design of electronics and systems / 
Kirk Gray, John James Paschkewitz. 
 - 1 online resource (299 pages) :  illustrations (some color) 
 - Wiley series in quality and reliability engineering .
 - Wiley series in quality and reliability engineering. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/>Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods. 
<br/><br/><label>ISBN: </label>9781118700204 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Accelerated life testing.<br/>Electronic systems--Design and construction.<br/>Electronic systems--Testing.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TA169.3  / .G73 2016 
<br/><br/><label>Dewey Class. No.: </label>621.381028/7