TY  - BOOK
AU  - Nadeau-Dostie,Benoit
ED  - ProQuest (Firm)
TI  - Design for at-speed test, diagnosis, and measurement
T2  - Frontiers in electronic testing
AV  - TK7874 .D47497 2000
U1  - 621.385 21
PY  - 2000///
CY  - Boston
PB  - Kluwer Academic
KW  - Integrated circuits
KW  - Testing
KW  - Electronic apparatus and appliances
KW  - Electronic books
N1  - Includes bibliographical references; Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=3035636
ER  -