TY  - BOOK
AU  - Yarlagadda,Prasad
AU  - Kim,Yun-Hae
ED  - International Conference on Measurement, Instrumentation and Automation
TI  - Measurement technology and its application III: selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China 
T2  - Applied Mechanics and Materials,
AV  - TA165 .I584 2014
U1  - 681.2 23
PY  - 2014///
CY  - Zurich, Switzerland
PB  - TTP
KW  - Detectors
KW  - Congresses
KW  - Measurement
KW  - Measuring instruments
KW  - Electronic books
N1  - Includes bibliographical references at the end of each chapters and indexes
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=1910833
ER  -