TY  - BOOK
AU  - Yamada-Kaneta,Hiroshi
AU  - Sakai,Akira
ED  - International Conference on Defects: Recognition, Imaging and Physics in Semiconductors
TI  - Defects-recognition, imaging and physics in semiconductors XIV: selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan 
T2  - Materials science forum
AV  - QC611.6.D4 I58 2011
PY  - 2012///]
CY  - Durnten-Zurich, Enfield, NH
PB  - Trans Tech Publications
KW  - Semiconductors
KW  - Defects
KW  - Congresses
KW  - Physics
KW  - Electronic books
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=1872887
ER  -