Defects-recognition, imaging and physics in semiconductors XIV :  selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / 
edited by Hiroshi Yamada-Kaneta and Akira Sakai. 
 - 1 online resource (300 pages). 
 - Materials science forum ;  vol. 725 .
 - Materials science forum ;  v. 725. .
<br/><br/><label>ISBN: </label>9783038138563 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Defects--Congresses.<br/>Physics--Congresses.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QC611.6.D4  / I58 2011