TY  - BOOK
AU  - Yablon,Dalia G.
TI  - Scanning probe microscopy for industrial applications: nanomechanical characterization 
AV  - TA417.23 .S336 2014
U1  - 620.1/127 23
PY  - 2014///
CY  - Hoboken, New Jersey
PB  - Wiley
KW  - Materials
KW  - Microscopy
KW  - Scanning probe microscopy
KW  - Industrial applications
KW  - Electronic books
N1  - Includes bibliographical references at the end of each chapters and index
UR  - https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=1483726
ER  -