Experimental micro/nanoscale thermal transport [electronic resource] / Xinwei Wang.

By: Wang, Xinwei, 1948-Contributor(s): ProQuest (Firm)Material type: TextTextPublication details: Hoboken, New Jersey : Wiley, 2012Description: xiii, 264 p. : illISBN: 9781118310199 (electronic bk.)Subject(s): Nanostructured materials -- Thermal properties | Heat -- TransmissionGenre/Form: Electronic books.DDC classification: 620.1/1596 LOC classification: TA418.9.N35 | W365 2012Online resources: Click to View Summary: "This book covers the new technologies on micro/nanoscale thermal characterization developed in the Micro/Nanoscale Thermal Science Laboratory led by Dr. Xinwei Wang. Five new non-contact and non-destructive technologies are introduced: optical heating and electrical sensing technique, transient electro-thermal technique, transient photo-electro-thermal technique, pulsed laser-assisted thermal relaxation technique, and steady-state electro-Raman-thermal technique. These techniques feature significantly improved ease of implementation, super signal-to-noise ratio, and have the capacity of measuring the thermal conductivity/diffusivity of various one-dimensional structures from dielectric, semiconductive, to metallic materials"-- Provided by publisher.
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Includes bibliographical references.

"This book covers the new technologies on micro/nanoscale thermal characterization developed in the Micro/Nanoscale Thermal Science Laboratory led by Dr. Xinwei Wang. Five new non-contact and non-destructive technologies are introduced: optical heating and electrical sensing technique, transient electro-thermal technique, transient photo-electro-thermal technique, pulsed laser-assisted thermal relaxation technique, and steady-state electro-Raman-thermal technique. These techniques feature significantly improved ease of implementation, super signal-to-noise ratio, and have the capacity of measuring the thermal conductivity/diffusivity of various one-dimensional structures from dielectric, semiconductive, to metallic materials"-- Provided by publisher.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

There are no comments on this title.

to post a comment.