Technology Assessment in a Globalized World : Facing the Challenges of Transnational Technology Governance.

By: Hennen, LeonhardContributor(s): Hahn, Julia | Ladikas, Miltos | Lindner, Ralf | Peissl, Walter | van Est, RinieMaterial type: TextTextPublisher: Cham : Springer International Publishing AG, 2023Copyright date: �2023Edition: 1st edDescription: 1 online resource (272 pages)Content type: text Media type: computer Carrier type: online resourceISBN: 9783031106170Genre/Form: Electronic books.Additional physical formats: Print version:: Technology Assessment in a Globalized WorldLOC classification: JF20-2112Online resources: Click to View
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Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2023. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.

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