Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza.

Contributor(s): Lanza, Mario [editor.]Material type: TextTextPublisher: Weinheim, Germany : Wiley-VCH, 2017Copyright date: 2017Description: 1 online resource (99 pages)Content type: text Media type: computer Carrier type: online resourceISBN: 9783527699797Subject(s): Atomic force microscopyGenre/Form: Electronic books.Additional physical formats: Print version:: Conductive atomic force microscopy : applications in nanomaterials.DDC classification: 502.82 LOC classification: QH212.A78 | .C663 2017Online resources: Click to View
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Includes bibliographical references at the end of each chapters and index.

Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2017).

Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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