Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.

By: (14th : International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (14th : 2011 : Miyazaki-shi, Japan)Contributor(s): Yamada-Kaneta, Hiroshi | Sakai, Akira (Professor of engineering science)Material type: TextTextSeries: Materials science forum ; v. 725.Publisher: Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]Copyright date: 2012Description: 1 online resource (300 pages)Content type: text Media type: computer Carrier type: online resourceISBN: 9783038138563Subject(s): Semiconductors -- Defects -- Congresses | Physics -- CongressesGenre/Form: Electronic books.LOC classification: QC611.6.D4 | I58 2011Online resources: Click to View
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Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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