Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.

By: Servin, Manuel [author.]Contributor(s): Quiroga, J. Antonio [author.] | Padilla, J. Moises [author.]Material type: TextTextPublisher: Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014Copyright date: 2014Description: 1 online resource (345 pages) : illustrationsContent type: text Media type: computer Carrier type: online resourceISBN: 9783527681082; 9783527681105Subject(s): Diffraction patterns -- Data processing | Image processing -- Data processingGenre/Form: Electronic books.Additional physical formats: Print version:: Fringe pattern analysis for optical metrology : theory, algorithms, and applications.DDC classification: 621.36 LOC classification: QC415 | .S478 2014Online resources: Click to View
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Includes bibliographical references and index.

Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014).

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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