Terrestrial neutron-induced soft errors in advanced memory devices [electronic resource] / Takashi Nakamura ... [et al.].
Material type: TextPublication details: Hackensack, NJ : World Scientific, c2008Description: xxii, 343 p. : ill. (some col.)Subject(s): Semiconductor storage devices | Neutron irradiation | Radiation dosimetry | Nuclear physicsGenre/Form: Electronic books.LOC classification: TK7895.M4 | T47 2008Online resources: Click to ViewNo physical items for this record
Includes bibliographical references (p. 291-315) and index.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
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