Scanning probe microscopy for industrial applications : nanomechanical characterization / edited by Dalia G. Yablon.

Contributor(s): Yablon, Dalia G, 1975-Material type: TextTextPublisher: Hoboken, New Jersey : Wiley, 2014Copyright date: 2014Description: 1 online resource (385 pages) : illustrations (some color), graphsContent type: text Media type: computer Carrier type: online resourceISBN: 9781118723142Subject(s): Materials -- Microscopy | Scanning probe microscopy -- Industrial applicationsGenre/Form: Electronic books.Additional physical formats: Print version:: Scanning probe microscopy for industrial applications : nanomechanical characterization.DDC classification: 620.1/127 LOC classification: TA417.23 | .S336 2014Online resources: Click to View
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Includes bibliographical references at the end of each chapters and index.

Description based on print version record.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

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