New Frontiers for Metrology : (Record no. 313986)

MARC details
000 -LEADER
fixed length control field 05397nam a22004813i 4500
001 - CONTROL NUMBER
control field EBC29070502
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240122001929.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m o d |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cnu||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 231124s2021 xx o ||||0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781643682471
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9781643682464
035 ## - SYSTEM CONTROL NUMBER
System control number (MiAaPQ)EBC29070502
035 ## - SYSTEM CONTROL NUMBER
System control number (Au-PeEL)EBL29070502
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)1311341048
040 ## - CATALOGING SOURCE
Original cataloging agency MiAaPQ
Language of cataloging eng
Description conventions rda
-- pn
Transcribing agency MiAaPQ
Modifying agency MiAaPQ
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC81
082 0# - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 389.1
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Milton, M. J. T.
245 10 - TITLE STATEMENT
Title New Frontiers for Metrology :
Remainder of title from Biology and Chemistry to Quantum and Data Science.
250 ## - EDITION STATEMENT
Edition statement 1st ed.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Amsterdam :
Name of producer, publisher, distributor, manufacturer IOS Press, Incorporated,
Date of production, publication, distribution, manufacture, or copyright notice 2021.
264 #4 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice �2021.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (480 pages)
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
490 1# - SERIES STATEMENT
Series statement Proceedings of the International School of Physics Enrico Fermi Series ;
Volume/sequential designation v.206
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Intro -- Title Page -- Contents -- M.J.T. Milton, D.S. Wiersma, C.J. Williams and M. Sega - Preface -- Course group shot -- Andrew J. Lewis - Realising the metre -- Andrew J. Lewis - Dimensional metrology in practice -- E. Massa - Avogadro, Planck and the kilogram redefinition -- Juris Meija - Traceability in chemical measurements: The role of data analysis -- Juris Meija - Atomic weights of the elements: From measurements to the Periodic Table -- S.M. Judge and D.T. Burns - Metrology for the safe and effective use of ionizing radiation. Part 1: Radiation dosimetry -- Carl J. Williams - The SI from platinum to Planck: The biggest revolution in metrology since the French Revolution -- Ekkehard Peik - Optical atomic clocks and tests of fundamental principles -- Paolo Brenni - The production and trade of scientific instruments (1750-1950) -- Martin J.T. Milton and Celine Fellag Ariouet - The metric system, the Metre Convention and the BIPM -- Gael Obein - The measurement of appearance -- S.M. Judge - Metrology for the safe and effective use of ionizing radiation. Part 2: Radioactivity -- A. Henson - Metrological traceability: A global perspective -- Steven Westwood, Gustavo Martos, Norbert Stoppacher and Robert Wielgosz - Metrological applications of NMR and qNMR in organic analysis -- Michela Sega - Reference Materials: Preparation, homogeneity, stability and value assignment -- Patrizia Tavella - Analysing and obtaining statistical information on time varying quantities -- Patrizia Tavella - Timekeeping and navigation systems -- W. Bich - Measurement uncertainty: Historical perspective, present status and foreseeable future -- Carl J. Williams, John H. Lehman and Christopher W. Oates - The future of metrology -- M.-O. Andre - Fundamentals and applications in electrical metrology -- Posters.
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note Benjamin A. Bircher - Computed tomography for dimensional metrology: Design considerations for high-resolution CT systems -- H. Salouros and M. Collins - Application of stable isotope ratio analysis to profiling methylamphetamine: Challenges to maintain comparability -- M. Marzano - Realization of the farad from the quantum Hall effect with a fully digital bridge: Progress report -- M. Marzano, M. Kruskopf and A.R. Panna - Bridge on a chip: Realization of a Kelvin bridge based on quantum Hall elements for resistance calibration -- B. Fang, H. Le Goff, B. Chupin, L. Lorini, M. Abgrall, P. Blonde, D. Rovera, P. Tuckey, P. Uhrich, J. Achkar, J. Guena, S. Zhang, N. Lucic, R. Le Tagart, Y. Le Coq, S. Bize, H. Alvarez-Martinez, N. Galland, S. Seidelin, A. Ferrier and P. Goldner - From atomic fountains to ultra-stable lasers -- I. Murataj and F. Ferrarese Lupi - Hyperbolic metamaterials by directed self-assembly of block copolymers -- Nompumelelo Leshabane, James Tshilongo, Shadung J. Moja, Napo G. Ntsasa, Gumani Mphaphuli and Mudalo I. Jozela - Improved measurement capabilities for hydrogen sulphide reference gas mixtures in South Africa -- A. Sacco and A.M. Rossi - Metrological aspects of tip-enhanced Raman spectroscopy -- Azure Hansen, Yun-Jhih Chen, John E. Kitching and Elizabeth A. Donley - Point-source atom interferometer gyroscope -- F. Berto and C. Sias - Prospects for single-photon sideband cooling of fermionic lithium -- Douglas G. Bopp, Matthew T. Hummon, Songbai Kang, John Kitching, Qing Li, Daron A. Westly, Sangsik Kim, Kartik Srinivasan and Vladimir Aksyuk - Chip-scale wavelength standards -- List of participants.
588 ## - SOURCE OF DESCRIPTION NOTE
Source of description note Description based on publisher supplied metadata and other sources.
590 ## - LOCAL NOTE (RLIN)
Local note Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2023. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metrology.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Metrology--Congresses.
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Wiersma, D. S.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Williams, C. J.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
Main entry heading Milton, M. J. T.
Title New Frontiers for Metrology: from Biology and Chemistry to Quantum and Data Science
Place, publisher, and date of publication Amsterdam : IOS Press, Incorporated,c2021
International Standard Book Number 9781643682464
797 2# - LOCAL ADDED ENTRY--CORPORATE NAME (RLIN)
Corporate name or jurisdiction name as entry element ProQuest (Firm)
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Proceedings of the International School of Physics Enrico Fermi Series
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=29070502">https://ebookcentral.proquest.com/lib/bacm-ebooks/detail.action?docID=29070502</a>
Public note Click to View

No items available.