Design for at-speed test, diagnosis, and measurement

Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. - Boston : Kluwer Academic, c2000. - xvii, 239 p. : ill. - Frontiers in electronic testing . - Frontiers in electronic testing. .

Includes bibliographical references.


Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.






Integrated circuits--Testing.
Electronic apparatus and appliances--Testing.


Electronic books.

TK7874 / .D47497 2000

621.385